Abstract
The atomic force microscopy(AFM) has been used, as a powerful tool, to investigate physical properties of
supported-lipid layers. Prior to the advent of the AFM, no observation was performed for the physical phenomena at the
nanometer-scale. This microscope provides nanometer-scale morphology by scanning surfaces with the cantilever and
presents force curve by monitoring the behavior of the cantilever that approaches to surface and retracts from the surface.
From the morphology, the structures of the supported lipid layer and the effect of other molecules on the structures
have been investigated. From the force curve, the surface properties–electrostatic and mechanical properties-of the supported
lipid layers have been studied. In this article, characterization of the structure and surface properties of the supported
lipid layer is explained. Future perspectives and direction are also discussed.
The atomic force microscopy(AFM) has been used, as a powerful tool, to investigate physical properties of
supported-lipid layers. Prior to the advent of the AFM, no observation was performed for the physical phenomena at the
nanometer-scale. This microscope provides nanometer-scale morphology by scanning surfaces with the cantilever and
presents force curve by monitoring the behavior of the cantilever that approaches to surface and retracts from the surface.
From the morphology, the structures of the supported lipid layer and the effect of other molecules on the structures
have been investigated. From the force curve, the surface properties–electrostatic and mechanical properties-of the supported
lipid layers have been studied. In this article, characterization of the structure and surface properties of the supported
lipid layer is explained. Future perspectives and direction are also discussed.
supported-lipid layers. Prior to the advent of the AFM, no observation was performed for the physical phenomena at the
nanometer-scale. This microscope provides nanometer-scale morphology by scanning surfaces with the cantilever and
presents force curve by monitoring the behavior of the cantilever that approaches to surface and retracts from the surface.
From the morphology, the structures of the supported lipid layer and the effect of other molecules on the structures
have been investigated. From the force curve, the surface properties–electrostatic and mechanical properties-of the supported
lipid layers have been studied. In this article, characterization of the structure and surface properties of the supported
lipid layer is explained. Future perspectives and direction are also discussed.
The atomic force microscopy(AFM) has been used, as a powerful tool, to investigate physical properties of
supported-lipid layers. Prior to the advent of the AFM, no observation was performed for the physical phenomena at the
nanometer-scale. This microscope provides nanometer-scale morphology by scanning surfaces with the cantilever and
presents force curve by monitoring the behavior of the cantilever that approaches to surface and retracts from the surface.
From the morphology, the structures of the supported lipid layer and the effect of other molecules on the structures
have been investigated. From the force curve, the surface properties–electrostatic and mechanical properties-of the supported
lipid layers have been studied. In this article, characterization of the structure and surface properties of the supported
lipid layer is explained. Future perspectives and direction are also discussed.
| Translated title of the contribution | Characterization of Supported Lipid Layers Using Atomic Force Microscopy |
|---|---|
| Original language | Korean |
| Pages (from-to) | 395-402 |
| Number of pages | 8 |
| Journal | Korean Chemical Engineering Research |
| Volume | 47 |
| Issue number | 4 |
| State | Published - Aug 2009 |