Abstract
Robust power delivery and distribution are considered one of the major challenges in electronic devices today. As a technology develops (i.e. frequency and complexity, increase and size decreases), both power density and power supply noise increase, and voltage supply margin decreases. In addition, thermal problem is induced due to high power and poor power distribution. Until now most of studies to improve power delivery and distribution have been focused on device circuit or system architecture designs. Interconnect process technologies to resolve power delivery issues have not greatly been explored so far, but recently it becomes of great interest as power increases and voltage specification decreases in a smaller chip size.
Translated title of the contribution | Interconnect Process Technology for High Power Delivery and Distribution |
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Original language | Korean |
Pages (from-to) | 9-14 |
Number of pages | 6 |
Journal | 마이크로전자 및 패키징학회지 |
Volume | 19 |
Issue number | 3 |
DOIs | |
State | Published - Sep 2012 |