A 0.6-V 400-KS/s Low Noise Asynchronous SAR ADC with Dual-Domain Comparison

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Abstract

This paper presents a low noise 0.6-V 400-KS/s asynchronous successive approximation register (SAR) analog-To-digital converter (ADC) with time domain comparator. The VCDL-based time domain comparator suppresses noise at low voltages but requires significant conversion time. Therefore, the sampling rate of the low voltage SAR ADC is increased by using a double-Tail comparator and asynchronous logic. An implemented 10-bit ADC in a 180-nm CMOS technology occupies 1130μm x 740μm. At a 0.6-V supply voltage and a 400-KS/s sampling rate, the proposed SAR ADC achieves a signal-To-noise and distortion ratio (SNDR) of 56.59 and an effective number of bits (ENOB) of 9.13 bits.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2021, ISOCC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages87-88
Number of pages2
ISBN (Electronic)9781665401746
DOIs
StatePublished - 2021
Event18th International System-on-Chip Design Conference, ISOCC 2021 - Jeju Island, Korea, Republic of
Duration: 6 Oct 20219 Oct 2021

Publication series

NameProceedings - International SoC Design Conference 2021, ISOCC 2021

Conference

Conference18th International System-on-Chip Design Conference, ISOCC 2021
Country/TerritoryKorea, Republic of
CityJeju Island
Period6/10/219/10/21

Keywords

  • analog-To-digital converter
  • asynchronous
  • double-Tail comparator
  • voltage-controlled delay line (VCDL)

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