A 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme without phase noise degradation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

This paper presents a 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme which has no phase noise degradation. The controllable loop filter enables the CDR circuit to change the operation mode without the output phase noise degradation and the stability problem. The modified half-rate linear phase detector reduces the phase error between the data and clock. A tested chip is manufactured using 0.13 m CMOS technology. The RMS jitter of the proposed CDR circuit is 5.98 ps-rms, which is 2.61 ps lower than the CDR circuit with the conventional scheme. The measured power dissipation is 138 mW with off-chip drivers at 5.4 Gb/s data rate.

Original languageEnglish
Title of host publication2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Pages430-433
Number of pages4
DOIs
StatePublished - 2011
Event2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011 - Rio de Janeiro, Brazil
Duration: 15 May 201118 May 2011

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2011 IEEE International Symposium of Circuits and Systems, ISCAS 2011
Country/TerritoryBrazil
CityRio de Janeiro
Period15/05/1118/05/11

Fingerprint

Dive into the research topics of 'A 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme without phase noise degradation'. Together they form a unique fingerprint.

Cite this