A flowmeter with piezoresistive metal layer deposited with focused-ion-beam system

Dae Keun Choi, Sang Hoon Lee

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

In this paper, we fabricated and evaluated a flowmeter with a sub-micron sized piezoresistive layer for the measurement in the small area. For the small area detection, the sensing material should be reduced as well as sensor body. We use the FIB system to reduce the size of the sensing material and obtain the sub-micron sized line width. The device is fabricated with the standardMEMS process, and the platinum layer is selected as the piezoresistive material considering the electrical conductivity. The 0∼4m/s air flows are applied to the flowmeter and the experimental results shows the negative sensitivity output with -3.22E-5/ms-1. This negative value is due to the additional materials like carbon and gallium. The various experiments including stability and repeatability are performed, and the repeated operation shows stable output signals with less than 9.6% variation. Through those experiment results, the FIB assisted platinum layer is suitable for the piezoresistive detection and a flowmeter can be applied to measurement of flow rate in the small area.

Original languageEnglish
Pages (from-to)157-167
Number of pages11
JournalIntegrated Ferroelectrics
Volume157
Issue number1
DOIs
StatePublished - 2014
Event4th International Symposium on Integrated Functionalities, ISIF 2013 - Grapevine, TX, United States
Duration: 28 Jul 201331 Jul 2013

Keywords

  • Flowmeter
  • Focused-ion-beam system (FIB system)
  • MEMS
  • Piezoresistive material
  • Small area detection

Fingerprint

Dive into the research topics of 'A flowmeter with piezoresistive metal layer deposited with focused-ion-beam system'. Together they form a unique fingerprint.

Cite this