Abstract
Measurement of the temperature in an integrated circuit (IC) is essential for evaluating temperature-dependent circuit performance. Using off-chip temperature sensors for this purpose has limited accuracy in sensing the on-chip temperature. For on-chip integration with ICs, a low-power and compact temperature sensor is required. Therefore, this letter presents a 2-Transistor (2T) voltage reference generator (VRG) that overcomes the limited sensitivity of conventional structures through the deep-subthreshold operation and achieves high (Formula presented.) – (Formula presented.) sensitivity by employing the narrow-width effect. The proposed 2T VRGs are implemented in 28-nm FD-SOI process and demonstrated to operate over a temperature range of 200 to 400 K, achieving a 0.86 mV/K (Formula presented.) – (Formula presented.) sensitivity with 3.6% relative inaccuracy.
| Original language | English |
|---|---|
| Article number | e70544 |
| Journal | Electronics Letters |
| Volume | 62 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1 Jan 2026 |
Keywords
- leakage currents
- temperature sensors
- voltage reference
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