A LOG-induced SSN-tolerant transceiver for on-chip interconnects in COG-packaged source driver IC for TFT-LCD

Won Young Lee, Jiehwan Oh, Lee Sup Kim

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

This brief presents a line-on-glass-induced simultaneous switching noise (SSN)-tolerant transceiver for on-chip interconnects in a chip-on-glass-packaged source driver IC for TFT-LCDs. An SSN compensator generates noise-sensitive bias voltages to maintain the bandwidth of a receiver. With each 10\% noise of VDD and GND, the proposed circuit shows an eye width of 0.542 UI with a bit error rate (BER) of 10-10 for 2-GB/s PRBS-7 while a conventional repeater shows an eye width of 0.132 UI with a BER of 4.62 × 10 -3 when pm 75-mV\rm pp VDD and GND noises are injected.

Original languageEnglish
Article number6409431
Pages (from-to)21-25
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume60
Issue number1
DOIs
StatePublished - 2013

Keywords

  • Line-on-glass (LOG)
  • on-chip interconnect
  • simultaneous switching noise (SSN)

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