TY - JOUR
T1 - A Low-Energy High-Density Capacitor-Less if Neuron Circuit Using Feedback FET Co-Integrated with CMOS
AU - Kwon, Min Woo
AU - Park, Kyungchul
AU - Baek, Myung Hyun
AU - Lee, Junil
AU - Park, Byung Gook
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019
Y1 - 2019
N2 - We have developed a capacitor-less IF neuron circuit with a dual gate positive feedback fieldeffect transistor (FBFET) and successfully co-integrated FBFET and CMOS in a wafer. By implementing the neuron circuit with FBFET, we can overcome the limits of conventional CMOS, reduce energy consumption, and imitate the biological neuron. The floating body of the FBFET can replace the membrane capacitor that occupies a large area and performs leaky integration of the neuron. Due to the extremely low sub-threshold swing of the FBFET (less than 0.528mv/dc), energy consumption of the neuron is significantly reduced by suppressing sub-threshold current. Finally, we analyzed the fabricated neuron circuit operation, retention time of the integrated charges and energy consumption compare to conventional CMOS neuron circuit.
AB - We have developed a capacitor-less IF neuron circuit with a dual gate positive feedback fieldeffect transistor (FBFET) and successfully co-integrated FBFET and CMOS in a wafer. By implementing the neuron circuit with FBFET, we can overcome the limits of conventional CMOS, reduce energy consumption, and imitate the biological neuron. The floating body of the FBFET can replace the membrane capacitor that occupies a large area and performs leaky integration of the neuron. Due to the extremely low sub-threshold swing of the FBFET (less than 0.528mv/dc), energy consumption of the neuron is significantly reduced by suppressing sub-threshold current. Finally, we analyzed the fabricated neuron circuit operation, retention time of the integrated charges and energy consumption compare to conventional CMOS neuron circuit.
KW - Integrate-and-fire neuron circuit
KW - floating body effect
KW - low energy consumption
KW - positive feedback FET
UR - https://www.scopus.com/pages/publications/85074520268
U2 - 10.1109/JEDS.2019.2941917
DO - 10.1109/JEDS.2019.2941917
M3 - Article
AN - SCOPUS:85074520268
SN - 2168-6734
VL - 7
SP - 1080
EP - 1084
JO - IEEE Journal of the Electron Devices Society
JF - IEEE Journal of the Electron Devices Society
M1 - 8840896
ER -