A new device characteristic model generation by machine learning

Min Hye Oh, Suhyun Bang, Min Woo Kwon, Byung Gook Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

This paper proposes a method to generate a characteristic model of a new device by machine learning. It is difficult new emerging devices and materials to have exact physical model to fit the behavior because developing physical models is complex and takes a long time. Therefore, we propose a regression method by machine learning as an alternative intermediate step of the physical model, and present guidelines for date preprocessing and proper architecture for efficient learning. It makes it easier and faster to solve general regression problems such as function generation.

Original languageEnglish
Title of host publication2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages466-468
Number of pages3
ISBN (Electronic)9781538665084
DOIs
StatePublished - Mar 2019
Event2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019 - Singapore, Singapore
Duration: 12 Mar 201915 Mar 2019

Publication series

Name2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019

Conference

Conference2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019
Country/TerritorySingapore
CitySingapore
Period12/03/1915/03/19

Keywords

  • Machine learning
  • model generation
  • New device modeling

Fingerprint

Dive into the research topics of 'A new device characteristic model generation by machine learning'. Together they form a unique fingerprint.

Cite this