A Study on Flexibility Improvement of AMOLED Back Plane and Mask Reduction Process Architecture Using Photo-sensitive Organic Insulation Films

In young Chung Guanghai Jin, Hyunsik Yoon

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, the method of patterning inter-layer deposition (ILD) and passivation layer (PVX) of the AMOLED back plane structure with an organic film was studied. By replacing the inorganic film of SiNx + SiO2 with an organic film Poly-imide, back plane suitable for flexible AMOLED was secured. It was possible to secure equivalent TFT transfer characteristics of device compared to inorganic inter layer structure by applying low- temperature buffer and 2nd gate insulator SiNx to the organic inter layer TFT device. Also, VIA + passivation layer 2 mask photo process was replaced with 1 mask photo process using a VIA Half-tone mask. Both processes were able to secure a process architecture that can be applied to flexible and rollable displays in the future by using photo-sensitive organic insulation films.

Original languageEnglish
Title of host publication2024 31st International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages191-194
Number of pages4
ISBN (Electronic)9784991216961
DOIs
StatePublished - 2024
Event31st International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2024 - Kyoto, Japan
Duration: 2 Jul 20245 Jul 2024

Publication series

Name2024 31st International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2024

Conference

Conference31st International Workshop on Active-Matrix Flatpanel Displays and Devices: TFT Technologies and FPD Materials, AM-FPD 2024
Country/TerritoryJapan
CityKyoto
Period2/07/245/07/24

Keywords

  • Inter layer deposition (ILD)
  • VIA Half-tone mask

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