A Sub-1.0V 20nm 5Gb/s/pin post-LPDDR3 I/O interface with Low Voltage-Swing Terminated Logic and adaptive calibration scheme for mobile application

Young Chul Cho, Yong Cheol Bae, Byoung Mo Moon, Yoon Joo Eom, Min Su Ahn, Won Young Lee, Cheong Ryong Cho, Min Ho Park, Young Jin Jeon, Jin Oh Ahn, Baek Kyu Choi, Dan Kyu Kang, Sang Hyuk Yoon, Yun Seok Yang, Kwang Il Park, Jung Hwan Choi, Jung Bae Lee, Joo Sun Choi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

21 Scopus citations

Abstract

A 5Gbp/s mobile memory I/O interface at sub-1.0V supply voltage with Low Voltage-Swing Terminated Logic (LVSTL) using a VSSQ (Ground) termination and an adaptive reference voltage calibration scheme is presented. Power efficiency is 2.4mW/Gbps/pin in 20nm mobile DRAM process, which is 44% lower value than that of LPDDR3.

Original languageEnglish
Title of host publication2013 Symposium on VLSI Circuits, VLSIC 2013 - Digest of Technical Papers
PagesC240-C241
StatePublished - 2013
Event2013 Symposium on VLSI Circuits, VLSIC 2013 - Kyoto, Japan
Duration: 12 Jun 201314 Jun 2013

Publication series

NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers

Conference

Conference2013 Symposium on VLSI Circuits, VLSIC 2013
Country/TerritoryJapan
CityKyoto
Period12/06/1314/06/13

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