TY - GEN
T1 - AFC Rule Check Framework for Construction Integrity of Semiconductor FAB MEP
T2 - 2025 5th International Conference on Robotics, Automation, and Artificial Intelligence, RAAI 2025
AU - Lee, Yunhyung
AU - Han, Seungwon
AU - Kim, Sean Hay
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This research addresses design-construction discrepancies in the mechanical, electrical, and plumbing (MEP) systems of semiconductor fabrication facilities (FABs). Given that even minor inconsistencies during the design phase can precipitate substantial rework expenditures during construction, enhancing design-construction integrity prior to procurement and field execution is paramount. The proposed Building Information Modeling (BIM)-based Approval for Construction (AFC) rule framework represents a technological advancement toward data-driven, automated validation of construction integrity. This framework is specifically designed to address the inherent complexity and stringent quality requirements characteristic of semiconductor FAB MEP projects, thereby supporting the achievement of quality, cost, and schedule objectives.
AB - This research addresses design-construction discrepancies in the mechanical, electrical, and plumbing (MEP) systems of semiconductor fabrication facilities (FABs). Given that even minor inconsistencies during the design phase can precipitate substantial rework expenditures during construction, enhancing design-construction integrity prior to procurement and field execution is paramount. The proposed Building Information Modeling (BIM)-based Approval for Construction (AFC) rule framework represents a technological advancement toward data-driven, automated validation of construction integrity. This framework is specifically designed to address the inherent complexity and stringent quality requirements characteristic of semiconductor FAB MEP projects, thereby supporting the achievement of quality, cost, and schedule objectives.
KW - Approval for construction
KW - BIM
KW - Construction
KW - MEP system
KW - Rule check
KW - Semiconductor
UR - https://www.scopus.com/pages/publications/105035984606
U2 - 10.1109/RAAI67517.2025.11423221
DO - 10.1109/RAAI67517.2025.11423221
M3 - Conference contribution
AN - SCOPUS:105035984606
T3 - 2025 5th International Conference on Robotics, Automation, and Artificial Intelligence, RAAI 2025
SP - 913
EP - 916
BT - 2025 5th International Conference on Robotics, Automation, and Artificial Intelligence, RAAI 2025
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 18 December 2025 through 20 December 2025
ER -