TY - GEN
T1 - An on-demand scrubbing solution for read disturbance error in phase-change memory
AU - Kim, Moonsoo
AU - Lee, Hyuk Jae
AU - Kim, Hyun
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/1
Y1 - 2020/1
N2 - Phase-change memory is a promising memory technology due to its attractive properties. However, phase-change memory is difficult to be commercialized because of its reliability issues. A read disturbance error, which is the main cause of reliability issues, occurs when a cell is repeatedly read. Conventional solution for read disturbance errors is periodically scrubbing the cells. However, this method requires read counters to count the number of reads per word. This paper proposes on-demand scrubbing solution which does not need read counters. The proposed method observes the number of errors in a word using the error-correcting code. If the number of errors is larger than the threshold, a scrubbing is performed to fix the errors. The proposed method removes nearly 1GB of hardware overhead caused by read counters, and fixes more than 99.99% of read disturbance errors.
AB - Phase-change memory is a promising memory technology due to its attractive properties. However, phase-change memory is difficult to be commercialized because of its reliability issues. A read disturbance error, which is the main cause of reliability issues, occurs when a cell is repeatedly read. Conventional solution for read disturbance errors is periodically scrubbing the cells. However, this method requires read counters to count the number of reads per word. This paper proposes on-demand scrubbing solution which does not need read counters. The proposed method observes the number of errors in a word using the error-correcting code. If the number of errors is larger than the threshold, a scrubbing is performed to fix the errors. The proposed method removes nearly 1GB of hardware overhead caused by read counters, and fixes more than 99.99% of read disturbance errors.
KW - On-demand scrubbing
KW - Phase-change memory
KW - Read disturbance error
UR - http://www.scopus.com/inward/record.url?scp=85083486113&partnerID=8YFLogxK
U2 - 10.1109/ICEIC49074.2020.9051213
DO - 10.1109/ICEIC49074.2020.9051213
M3 - Conference contribution
AN - SCOPUS:85083486113
T3 - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
BT - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
Y2 - 19 January 2020 through 22 January 2020
ER -