Analysis of vacuum ultra violet spectra from plasma display panel with He-Ne-Xe mixture

Jeong Hyun Seo, Heui Seob Jeong, Cha Keun Yoon, Joong Kyun Kim, Ki Woong Whang, Jong W. Shon

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

VUV (Vacuum ultra violet) spectra have been measured to understand the discharge chemistry in an AC type color PDP (Plasma Display Panel) cell containing He-Ne-Xe gas mixture. The luminance and relative intensities of VUV spectral lines from Xe* and Xe2* are dependent on the He/Ne mixing ratio. Xe I resonance line increases with Ne content increases and Xe2* molecular emission increases with Ne content increases. A plasma chemistry model is used to explain the changes in VUV spectra as a function of He/Ne mixing ratio. The solution of electron Boltzmann equation indicates that the electron temperature decreases as He content increases. Thus the density of Xe* decreases and that of Xe2* increases as the He content increases due to the decreased electron impact reaction. NeXe* dimer formation at high Ne content could compete with the formation of Xe2*.

Original languageEnglish
Pages (from-to)293-296
Number of pages4
JournalSID Conference Record of the International Display Research Conference
StatePublished - 1997
EventProceedings of the 1997 17th Annual International Display Research Conference - Toronto, Can
Duration: 15 Sep 199719 Sep 1997

Fingerprint

Dive into the research topics of 'Analysis of vacuum ultra violet spectra from plasma display panel with He-Ne-Xe mixture'. Together they form a unique fingerprint.

Cite this