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Bonding characterization of oxidized PDMS thin films
J. J. McMahon
,
Y. Kwon
, J. Q. Lu
, T. S. Cale
, R. J. Gutmann
Dept. of Chemical and Biomolecular Engineering
Rensselaer Polytechnic Institute
Research output
:
Contribution to journal
›
Conference article
›
peer-review
5
Scopus citations
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Engineering
Thin Films
100%
Polydimethylsiloxane
100%
Borosilicate Glass
50%
Material Surface
16%
Dielectrics
16%
Bonding Material
16%
Silicon Substrate
16%
Spin Cast
16%
Glass Substrate
16%
Modified Surface
16%
Material Interface
16%
Material Science
Thin Films
100%
Poly(Dimethylsiloxane)
100%
Silicon
33%
Film
16%
Surface (Surface Science)
16%
Dielectric Material
16%
Adhesive Bonding
16%
Bond Strength (Materials)
16%
Interface Property
16%
Surface Property
16%