Breakdown Characteristics of CMOS Schottky Barrier Diode with Guard Ring

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@article{b5414358d0ae49728f1f2dbf1db155bf,

title = "Breakdown Characteristics of CMOS Schottky Barrier Diode with Guard Ring",

author = "Shim, \{Dong Ha\}",

year = "2025",

month = mar,

doi = "Not available",

language = "English",

volume = "24",

journal = "반도체디스플레이기술학회지",

issn = "1738-2270",

publisher = "한국반도체디스플레이기술학회",

number = "1",

}