Characterization of resistive switching memory devices with tunnel barrier
- Sungjun Kim
- , Min Hwi Kim
- , Tae Hyeon Kim
- , Suhyun Bang
- , Dong Keun Lee
- , Yao Feng Chang
- , Byung Gook Park
- Seoul National University
- University of Texas at Austin
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review