TY - GEN
T1 - Control techniques for high-speed dynamic mode imaging in atomic force microscopes
AU - Mohan, Gayathri
AU - Lee, Chibum
AU - Salapaka, Srinivasa
PY - 2011
Y1 - 2011
N2 - This paper proposes a new dynamic mode of operation in an Atomic Force Microscope (AFM) where the deflection signal is used for force regulation instead of its derivatives such as the amplitude and phase. This mode is especially useful in AFMs with high speed positioning systems with bandwidths of the order of ≈ 1/10 times the natural frequency of the scanning probe. We formulate this problem in an optimal control setting and employ multiobjective optimization techniques to design the regulating controller. Furthermore, we present a method to estimate the tip-sample interaction force and extract the sample topography information from this estimate. The overall scheme facilitates high speed imaging that can potentially exploit fast scanning devices without compromising on the bandwidth and resolution. Simulation results show a regulation bandwidth of 10-15% of the natural frequency of the probe.
AB - This paper proposes a new dynamic mode of operation in an Atomic Force Microscope (AFM) where the deflection signal is used for force regulation instead of its derivatives such as the amplitude and phase. This mode is especially useful in AFMs with high speed positioning systems with bandwidths of the order of ≈ 1/10 times the natural frequency of the scanning probe. We formulate this problem in an optimal control setting and employ multiobjective optimization techniques to design the regulating controller. Furthermore, we present a method to estimate the tip-sample interaction force and extract the sample topography information from this estimate. The overall scheme facilitates high speed imaging that can potentially exploit fast scanning devices without compromising on the bandwidth and resolution. Simulation results show a regulation bandwidth of 10-15% of the natural frequency of the probe.
UR - https://www.scopus.com/pages/publications/84860696419
U2 - 10.1109/CDC.2011.6160734
DO - 10.1109/CDC.2011.6160734
M3 - Conference contribution
AN - SCOPUS:84860696419
SN - 9781612848006
T3 - Proceedings of the IEEE Conference on Decision and Control
SP - 651
EP - 656
BT - 2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2011 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011
Y2 - 12 December 2011 through 15 December 2011
ER -