TY - JOUR
T1 - Design of A prototype 128 × 128 ROIC array for 2.6 μm-wavelength SWIR image sensor applications
AU - Kim, Hyeon June
N1 - Publisher Copyright:
© 2024
PY - 2024/9
Y1 - 2024/9
N2 - This paper presents the development and evaluation of a 128 × 128 Readout Integrated Circuit (ROIC) prototype, engineered for Short-Wave Infrared (SWIR) imaging at a specific target wavelength of 2.6 μm. Employing silicon-level verification, this work undertook an exhaustive analysis of the ROIC's performance, identifying key areas for enhancement to improve SWIR imaging systems. Fabricated with 0.18-μm CMOS technology, the ROIC is tailored for integration with Indium Gallium Arsenide (InGaAs) Focal Plane Arrays (FPAs), facilitating high-resolution imaging. The prototype consumes 42.25 mW of power and achieves a frame rate of 390 frames per second. The fabricated chip show that the random noise level is 72.65 μVrms and Pixel-FPN is 21 LSBrms. This investigation lays a critical groundwork for future SWIR imaging advancements, providing valuable insights and methodologies to boost imaging performance in various applications.
AB - This paper presents the development and evaluation of a 128 × 128 Readout Integrated Circuit (ROIC) prototype, engineered for Short-Wave Infrared (SWIR) imaging at a specific target wavelength of 2.6 μm. Employing silicon-level verification, this work undertook an exhaustive analysis of the ROIC's performance, identifying key areas for enhancement to improve SWIR imaging systems. Fabricated with 0.18-μm CMOS technology, the ROIC is tailored for integration with Indium Gallium Arsenide (InGaAs) Focal Plane Arrays (FPAs), facilitating high-resolution imaging. The prototype consumes 42.25 mW of power and achieves a frame rate of 390 frames per second. The fabricated chip show that the random noise level is 72.65 μVrms and Pixel-FPN is 21 LSBrms. This investigation lays a critical groundwork for future SWIR imaging advancements, providing valuable insights and methodologies to boost imaging performance in various applications.
KW - Column sampling technique
KW - Global sampling technique
KW - Indium Gallium Arsenide (InGaAs) SWIR Detectors
KW - Readout integrated circuit (ROIC)
KW - Short-wave infrared (SWIR) imaging
UR - https://www.scopus.com/pages/publications/85196370603
U2 - 10.1016/j.vlsi.2024.102232
DO - 10.1016/j.vlsi.2024.102232
M3 - Article
AN - SCOPUS:85196370603
SN - 0167-9260
VL - 98
JO - Integration
JF - Integration
M1 - 102232
ER -