Development of a program for high-temperature design analysis and defect assessment according to RCC-MRX

Hyeong Yeon Lee, Nam Su Huh, Min Gu Won, Woo Gon Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A program for a high-temperature design analysis and defect assessment has been developed for an elevated temperature evaluation according to the RCC-MRx for Generation IV and fusion reactor systems. The program, called ‘HITEP_RCC-MRx,’ consists of three modules: ‘HITEP_RCC-DBA,’ which computerizes the design-by-analysis (DBA) for class 1 components such as the pressure vessel and heat exchangers according to RB-3200 procedures, ‘HITEP_RCC-PIPE,’ which computerizes the design-by-rule (DBR) analysis for class 1 piping according to RB-3600 procedures and ‘HITEP_RCC-A16,’ which computerizes high-temperature defect assessment according to the A16 procedures. It is a web-based program, and thus can operate on a smartphone as well as on a personal computer once it is connected to the URL. The program has been verified with a number of relevant example problems on DBA, Pipe, and A16. It was shown from the verification works that HITEP_RCC-MRx with the three modules conducts a design evaluation and a defect assessment in an efficient and reliable way.

Original languageEnglish
Title of host publicationCodes and Standards
PublisherAmerican Society of Mechanical Engineers (ASME)
ISBN (Electronic)9780791851586
DOIs
StatePublished - 2018
EventASME 2018 Pressure Vessels and Piping Conference, PVP 2018 - Prague, Czech Republic
Duration: 15 Jul 201820 Jul 2018

Publication series

NameAmerican Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP
Volume1A-2018
ISSN (Print)0277-027X

Conference

ConferenceASME 2018 Pressure Vessels and Piping Conference, PVP 2018
Country/TerritoryCzech Republic
CityPrague
Period15/07/1820/07/18

Fingerprint

Dive into the research topics of 'Development of a program for high-temperature design analysis and defect assessment according to RCC-MRX'. Together they form a unique fingerprint.

Cite this