Effect of crystalline structure of TiO 2 substrates on initial growth of atomic layer deposited Ru thin films

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Abstract

Ru thin films were grown on polymorphic TiO 2 thin film substrates at 230 and 250 °C by atomic layer deposition using 2,4-(dimethylpentadienyl)(ethylcyclopentadienyl)Ru and an O 2 gas. While the Ru films grown on amorphous and rutile TiO 2 substrates showed a relatively long incubation cycle number of approximately 350 and 100 at 230 and 250 °C, respectively, the Ru films grown on anatase TiO 2 substrates exhibited a significantly shorter incubation delay which was attributed to the catalytic activity of anatase TiO 2 . This difference in the incubation cycle affected the surface morphology of the Ru films on different TiO 2 substrates.

Original languageEnglish
Pages (from-to)4302-4305
Number of pages4
JournalApplied Surface Science
Volume257
Issue number9
DOIs
StatePublished - 15 Feb 2011

Keywords

  • Atomic layer deposition
  • Initial growth
  • Ru

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