Abstract
Ru thin films were grown on polymorphic TiO 2 thin film substrates at 230 and 250 °C by atomic layer deposition using 2,4-(dimethylpentadienyl)(ethylcyclopentadienyl)Ru and an O 2 gas. While the Ru films grown on amorphous and rutile TiO 2 substrates showed a relatively long incubation cycle number of approximately 350 and 100 at 230 and 250 °C, respectively, the Ru films grown on anatase TiO 2 substrates exhibited a significantly shorter incubation delay which was attributed to the catalytic activity of anatase TiO 2 . This difference in the incubation cycle affected the surface morphology of the Ru films on different TiO 2 substrates.
| Original language | English |
|---|---|
| Pages (from-to) | 4302-4305 |
| Number of pages | 4 |
| Journal | Applied Surface Science |
| Volume | 257 |
| Issue number | 9 |
| DOIs | |
| State | Published - 15 Feb 2011 |
Keywords
- Atomic layer deposition
- Initial growth
- Ru