Engineering nvCap From FEOL to BEOL with Ferroelectric Small-signal Non-destructive Read

Tae Hyeon Kim, Yuan Chun Luo, Omkar Phadke, James Read, Shimeng Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Non-volatile ferroelectric capacitor (nvCap) that leverages the small-signal non-destructive read is a new concept to the ferroelectric memory family. nvCap overcomes the endurance limitation imposed by the destructive read in conventional ferroelectric random access memory (FeRAM) that relies on large-signal polarization switching. nvCap is also a promising candidate to enable the charge domain computation in a capacitive crossbar array for in-memory computing that only consumes dynamic power. The key engineering goal of nvCap is to optimize a asymmetric C-V characteristics to open up the large capacitance on/off ratio at DC zero voltage. In this invited paper, we present the progresses of our work on optimizing the nvCap device. We first introduce the HZO-based MFM nvCap that demonstrates the proof-of-concept, and present the FeFET-based MFS nvCap that improves capacitance on/off ratio with reliability/scaling analysis. Finally we report our new results on BEOL-compatible MFS nvCap based on a oxide semiconductor layer.

Original languageEnglish
Title of host publication2024 IEEE International Memory Workshop, IMW 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350306521
DOIs
StatePublished - 2024
Event16th IEEE International Memory Workshop, IMW 2024 - Seoul, Korea, Republic of
Duration: 12 May 202415 May 2024

Publication series

Name2024 IEEE International Memory Workshop, IMW 2024 - Proceedings

Conference

Conference16th IEEE International Memory Workshop, IMW 2024
Country/TerritoryKorea, Republic of
CitySeoul
Period12/05/2415/05/24

Keywords

  • Back-end-of-line compatibility
  • Ferroelectrics
  • In-memory computing
  • Non-volatile memory

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