Estimation of On-demand Scrubbing Points in Phase-Change Memory without Read Counter

Joohan Yi, Hyun Kim, Hyuk Jae Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Phase Change Memory (PCM) has recently become a promising memory system due to its appealing properties. However, PCM shows several issues to overcome that can obscure its effectiveness compared to other memory technologies. One of them is the read disturbance error (RDE), which is occurred when a cell is repeatedly read It is the main cause of reliability issues of the PCM. This paper proposes an on-demand scrubbing solution without read counters. Probability of uncorrectable error in the next RDE are modeled by the number of errors detected by error correction code. This method can reduce lGB of hardware overhead of read counters.

Original languageEnglish
Title of host publication2021 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665408578
DOIs
StatePublished - 2021
Event2021 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2021 - Gangwon, Korea, Republic of
Duration: 1 Nov 20213 Nov 2021

Publication series

Name2021 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2021

Conference

Conference2021 IEEE International Conference on Consumer Electronics-Asia, ICCE-Asia 2021
Country/TerritoryKorea, Republic of
CityGangwon
Period1/11/213/11/21

Keywords

  • On-demand Scrubbing
  • Phase Change Memory (PCM)
  • Read Disturbance Error

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