Evaluating the worst-case performance of flash translation layer

Ilhoon Shin

doi:10.1007/978-3-642-35248-5_5

Evaluating the worst-case performance of flash translation layer

Ilhoon Shin

Electronic Engineering Program

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

NAND-based block devices are widely used in various computing devices, and the intesive studies have been performed to improve the average performance of NAND-based block devices with desiging efficient flash translation layer (FTL) schemes. However, the worst-case performance has been beyond the focus. The goal of this work is to evaluate the worst-case performance of the representive FTL schemes. The trace-drive simulation shows that the page mapping scheme delivers the best worst-case performance. In contrast, the FAST scheme and the SBAST scheme, which deliver a good average performance, are bad in the aspect of the worst-case performance.

Original language	English
Title of host publication	Computer Applications for Modeling, Simulation, and Automobile - International Conferences, MAS and ASNT 2012, Held in Conjunction with GST 2012, Proceedings
Publisher	Springer Verlag
Pages	27-33
Number of pages	7
ISBN (Print)	9783642352478
DOIs	https://doi.org/10.1007/978-3-642-35248-5_5
State	Published - 2012
Event	2012 International Conference on Modeling and Simulation, MAS 2012 and the 2012 International Conference on Automotive Science and Technology, ASNT 2012, Held in Conjunction with GST 2012 - Jeju Island, Korea, Republic of Duration: 28 Nov 2012 → 2 Dec 2012

Publication series

Name	Communications in Computer and Information Science
Volume	341 CCIS
ISSN (Print)	1865-0929

Conference

Conference	2012 International Conference on Modeling and Simulation, MAS 2012 and the 2012 International Conference on Automotive Science and Technology, ASNT 2012, Held in Conjunction with GST 2012
Country/Territory	Korea, Republic of
City	Jeju Island
Period	28/11/12 → 2/12/12

Keywords

flash translation layer
NAND-based block devices
worst-case performance

Access to Document

10.1007/978-3-642-35248-5_5

Cite this

Shin, I. (2012). Evaluating the worst-case performance of flash translation layer. In Computer Applications for Modeling, Simulation, and Automobile - International Conferences, MAS and ASNT 2012, Held in Conjunction with GST 2012, Proceedings (pp. 27-33). (Communications in Computer and Information Science; Vol. 341 CCIS). Springer Verlag. https://doi.org/10.1007/978-3-642-35248-5_5

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title = "Evaluating the worst-case performance of flash translation layer",

abstract = "NAND-based block devices are widely used in various computing devices, and the intesive studies have been performed to improve the average performance of NAND-based block devices with desiging efficient flash translation layer (FTL) schemes. However, the worst-case performance has been beyond the focus. The goal of this work is to evaluate the worst-case performance of the representive FTL schemes. The trace-drive simulation shows that the page mapping scheme delivers the best worst-case performance. In contrast, the FAST scheme and the SBAST scheme, which deliver a good average performance, are bad in the aspect of the worst-case performance.",

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author = "Ilhoon Shin",

year = "2012",

doi = "10.1007/978-3-642-35248-5\_5",

language = "English",

isbn = "9783642352478",

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note = "2012 International Conference on Modeling and Simulation, MAS 2012 and the 2012 International Conference on Automotive Science and Technology, ASNT 2012, Held in Conjunction with GST 2012 ; Conference date: 28-11-2012 Through 02-12-2012",

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Shin, I 2012, Evaluating the worst-case performance of flash translation layer. in Computer Applications for Modeling, Simulation, and Automobile - International Conferences, MAS and ASNT 2012, Held in Conjunction with GST 2012, Proceedings. Communications in Computer and Information Science, vol. 341 CCIS, Springer Verlag, pp. 27-33, 2012 International Conference on Modeling and Simulation, MAS 2012 and the 2012 International Conference on Automotive Science and Technology, ASNT 2012, Held in Conjunction with GST 2012, Jeju Island, Korea, Republic of, 28/11/12. https://doi.org/10.1007/978-3-642-35248-5_5

Evaluating the worst-case performance of flash translation layer. / Shin, Ilhoon.
Computer Applications for Modeling, Simulation, and Automobile - International Conferences, MAS and ASNT 2012, Held in Conjunction with GST 2012, Proceedings. Springer Verlag, 2012. p. 27-33 (Communications in Computer and Information Science; Vol. 341 CCIS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - NAND-based block devices are widely used in various computing devices, and the intesive studies have been performed to improve the average performance of NAND-based block devices with desiging efficient flash translation layer (FTL) schemes. However, the worst-case performance has been beyond the focus. The goal of this work is to evaluate the worst-case performance of the representive FTL schemes. The trace-drive simulation shows that the page mapping scheme delivers the best worst-case performance. In contrast, the FAST scheme and the SBAST scheme, which deliver a good average performance, are bad in the aspect of the worst-case performance.

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KW - NAND-based block devices

KW - worst-case performance

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DO - 10.1007/978-3-642-35248-5_5

M3 - Conference contribution

AN - SCOPUS:84869752124

SN - 9783642352478

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Y2 - 28 November 2012 through 2 December 2012

ER -

Evaluating the worst-case performance of flash translation layer

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