Abstract
We report ultrafast recrystallization of perovskite (methylammonium lead tribromide, MAPbBr3)by flash light annealing (FLA)for light-emitting diode (LED)application. Intense near-infrared (NIR)peak spectrum (830 and 900 nm)of flash light could rapidly heat MAPbBr3 based LED structures over ∼320 °C without radiative damage. Cuboidal morphology of the perovskite active layer was evolved into the dense recrystallized structure with a noticeably small grain size (∼38 nm)by FLA, which significantly promoted the radiative recombination. Surface roughness (root mean square (RMS))of the perovskite layer was decreased by 62% (from 8.47 to 3.22 nm)via FLA, while inhibiting the leakage current that limit current efficiency (CE)of perovskite LED (PeLED). Three dimensional temperature simulation was investigated for the mechanism of flash-induced MAPbBr3 recrystallization. Finally, FLA was successfully exploited for the flexible PeLEDs on polyethylene naphthalate substrates, which exhibited 252% larger CE compared to thermally annealed counterpart.
| Original language | English |
|---|---|
| Pages (from-to) | 236-244 |
| Number of pages | 9 |
| Journal | Nano Energy |
| Volume | 61 |
| DOIs | |
| State | Published - Jul 2019 |
Keywords
- Flash
- Flexible electronics
- Light-emitting diode
- Perovskite
- Recrystallization