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Formation and process optimization of scanning resistive probe
Hyunjung Shin
, Chanhyung Kim
, Bongki Lee
, Jiyoung Kim
, Hongsik Park
, Dong Ki Min
, Juwhan Jung
, Seungbum Hong
,
Sungdong Kim
Dept. of Mechanical System and Design Engineering
Kookmin University
University of Texas at Dallas
Samsung
Research output
:
Contribution to journal
›
Article
›
peer-review
6
Scopus citations
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Material Science
Surface Charge
100%
Current-Voltage Characteristic
100%
Engineering
Resistive
100%
Barrier Height
20%
Resistance Change
20%
Process Parameter
20%
Current-Voltage Characteristic
20%
Earth and Planetary Sciences
Space Charge
100%