Gas barrier and mechanical properties of a single-layer silicon oxide film prepared by roll-to-roll PECVD system

Seong Keun Cho, Tae Yeon Cho, Won Jae Lee, Min Seop Um, Woo Jin Choi, Jae Heung Lee, Juwhan Ryu, Sung Hoon Choa

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

We presented a single-layer silicon oxide (SiOx) barrier film with excellent moisture barrier performance and flexibility. High quality, continuous, and large-area barrier film was deposited on polyethyleneterephthalate substrate using a roll-to-roll PECVD for large-scale production. The effects of the reaction gas flow ratio of N 2 O/SiH 4 (R) on the characteristics of the SiOx film were systematically analyzed in terms of the optical properties, surface roughness, film density, hardness, chemical composition, and water vapor transmission rate. The SiOx film exhibited the best film density, hardness, surface roughness, and superior barrier performance of 1.6 × 10 −3 g · m −2 · d −2 at R = 1.5. The SiOx barrier film also exhibited excellent flexibility which bent up to 2 mm and withstood the repeated bending of 10 000 cycles.

Original languageEnglish
Article number1800170
JournalPlasma Processes and Polymers
Volume16
Issue number4
DOIs
StatePublished - Apr 2019

Keywords

  • bendability
  • roll-to-roll plasma deposition
  • silicon oxide film
  • single-layer barrier film
  • water vapor transmission rate

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