Gated-thyristor DRAM cell with pillar channel structure

Hyungjin Kim, Min Woo Kwon, Myung Hyun Baek, Sungmin Hwang, Sihyun Kim, Taejin Jang, Jeong Jun Lee, Hyun Min Kim, Kitae Lee, Byung Gook Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, a DRAM cell based on gated-thyristor having pillar channel and sidewall gate is proposed and investigated through device simulation study. Stored electrons in the base region make a difference in read current lowering potential barrier. It has a fast writing speed under 10 ns because of its mechanism based on thermal injection and highly scalable structure because of self-connected word line.

Original languageEnglish
Title of host publication2017 Silicon Nanoelectronics Workshop, SNW 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages71-72
Number of pages2
ISBN (Electronic)9784863486478
DOIs
StatePublished - 29 Dec 2017
Event22nd Silicon Nanoelectronics Workshop, SNW 2017 - Kyoto, Japan
Duration: 4 Jun 20175 Jun 2017

Publication series

Name2017 Silicon Nanoelectronics Workshop, SNW 2017
Volume2017-January

Conference

Conference22nd Silicon Nanoelectronics Workshop, SNW 2017
Country/TerritoryJapan
CityKyoto
Period4/06/175/06/17

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