Gated-thyristor DRAM cell with pillar channel structure

  • Hyungjin Kim
  • , Min Woo Kwon
  • , Myung Hyun Baek
  • , Sungmin Hwang
  • , Sihyun Kim
  • , Taejin Jang
  • , Jeong Jun Lee
  • , Hyun Min Kim
  • , Kitae Lee
  • , Byung Gook Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this work, a DRAM cell based on gated-thyristor having pillar channel and sidewall gate is proposed and investigated through device simulation study. Stored electrons in the base region make a difference in read current lowering potential barrier. It has a fast writing speed under 10 ns because of its mechanism based on thermal injection and highly scalable structure because of self-connected word line.

Original languageEnglish
Title of host publication2017 Silicon Nanoelectronics Workshop, SNW 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages71-72
Number of pages2
ISBN (Electronic)9784863486478
DOIs
StatePublished - 29 Dec 2017
Event22nd Silicon Nanoelectronics Workshop, SNW 2017 - Kyoto, Japan
Duration: 4 Jun 20175 Jun 2017

Publication series

Name2017 Silicon Nanoelectronics Workshop, SNW 2017
Volume2017-January

Conference

Conference22nd Silicon Nanoelectronics Workshop, SNW 2017
Country/TerritoryJapan
CityKyoto
Period4/06/175/06/17

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