Grain size reduction of CoCrPt-SiO2 media by oxidation of RuCr intermediate layer grain boundary

Sang Hwan Park, Seon Ok Kim, Hoon Sang Oh, Sung Hoon Choa, Taek Dong Lee

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

The grain size reduction mechanism of CoCrPt-SiO2 perpendicular magnetic recording media by oxygen reactive sputtering of RuCr intermediate layer has been investigated as a function of oxygen content in the Ar sputtering gas. The media stack was Ta/Ru/RuCr/CoCrPt-SiO2. It was found that, by the oxygen addition, Cr and Ru oxides were formed at grain boundaries of the RuCr layer and this was the reason of the intermediate layer grain size reduction, which induced the reduction of the recording layer grain size. C-axis alignment of RuCr (0002) plane, however, was degraded as the oxygen gas ratio increased.

Original languageEnglish
Pages (from-to)4516-4519
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume4
Issue number12
DOIs
StatePublished - 2007
EventInternational Symposium on Advanced Magnetic Materials and Appilications, (ISAMMA 2007) - Jeju, Korea, Republic of
Duration: 28 May 20071 Jun 2007

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