TY - JOUR
T1 - High-Performance Nanostructured Flexible Capacitor by Plasma-Induced Low-Temperature Atomic Layer Annealing
AU - Lee, Jaehyeong
AU - Go, Dohyun
AU - Lee, Useung
AU - Lee, Seunghyeon
AU - Kim, Keun Hoi
AU - Shin, Jeong Woo
AU - Kim, Hyein
AU - Ok, Jong G.
AU - An, Jihwan
N1 - Publisher Copyright:
© 2022 Wiley-VCH GmbH.
PY - 2023/1/10
Y1 - 2023/1/10
N2 - Fabricating high-quality thin films on a 3D structured polymer substrate is crucial in realizing high-performance flexible electronics. Herein, simple yet effective twofold strategies are demonstrated to directly fabricate flexible thin film capacitors on polymer substrate: the crystallization of high-k TiO2 film by plasma-assisted atomic layer annealing at low temperature (80 °C) on nanostructured polycarbonate (PC) substrates fabricated by simple dynamic nanoinscribing (DNI) technique. Plasma-induced amorphous-to-anatase phase transformation occurs in PEALD TiO2/ZrO2 bilayer thin films, resulting in the capacitance density increase by 30%. The DNI patterning of PC substrates in two directions further increases the surface area by 35% and the capacitance density by 37%, leading to the flexible capacitor of a record-high capacitance density (24.2 nF mm−2) with mechanical stability.
AB - Fabricating high-quality thin films on a 3D structured polymer substrate is crucial in realizing high-performance flexible electronics. Herein, simple yet effective twofold strategies are demonstrated to directly fabricate flexible thin film capacitors on polymer substrate: the crystallization of high-k TiO2 film by plasma-assisted atomic layer annealing at low temperature (80 °C) on nanostructured polycarbonate (PC) substrates fabricated by simple dynamic nanoinscribing (DNI) technique. Plasma-induced amorphous-to-anatase phase transformation occurs in PEALD TiO2/ZrO2 bilayer thin films, resulting in the capacitance density increase by 30%. The DNI patterning of PC substrates in two directions further increases the surface area by 35% and the capacitance density by 37%, leading to the flexible capacitor of a record-high capacitance density (24.2 nF mm−2) with mechanical stability.
KW - atomic layer annealing
KW - dynamic nanoinscribing
KW - flexible capacitors
KW - in situ crystallization
KW - plasma-enhanced atomic layer deposition
KW - thin film capacitors
UR - https://www.scopus.com/pages/publications/85139393012
U2 - 10.1002/admt.202201134
DO - 10.1002/admt.202201134
M3 - Article
AN - SCOPUS:85139393012
SN - 2365-709X
VL - 8
JO - Advanced Materials Technologies
JF - Advanced Materials Technologies
IS - 1
M1 - 2201134
ER -