Improved gradual reset phenomenon in SiNx-based RRAM by diode-connected structure

  • Min Hwi Kim
  • , Suhyun Bang
  • , Tae Hyeon Kim
  • , Dong Keun Lee
  • , Sungjun Kim
  • , Seongjae Cho
  • , Byung Gook Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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Material Science