Investigation of MEMS resonator characteristics during long-term and wide temperature variation operation

  • Bongsang Kim
  • , Rob N. Candler
  • , Matthew Hopcroft
  • , Manu Agarwal
  • , Woo Tae Park
  • , Jeffrey T. Li
  • , Thomas Kenny

Research output: Contribution to journalConference articlepeer-review

18 Scopus citations

Abstract

Two types of single-crystal silicon micromechanical resonators having resonant frequencies at 150 kHz and 130 kHz were tested under harsh environment to investigate stability. To observe long-term stability, the main characteristics, such as resonant frequency and quality factor were measured over 2,500 hrs continuously while maintaining constant environmental temperature at 25°C±0.1°C. A separate experiment was also initiated to show stability during temperature cycling from -50 °C to 80 °C. In both experiments, the total change in resonant frequency were less than 10 ppm and quality factor less than 10%, which demonstrates the stability of encapsulated micromechanical resonators upon exposure to harsh environments.

Original languageEnglish
Article numberIMECE2004-61727
Pages (from-to)413-416
Number of pages4
JournalAmerican Society of Mechanical Engineers, Micro-Electro Mechanical Systems Division, (Publications) MEMS
DOIs
StatePublished - 2004
Event2004 ASME International Mechanical Engineering Congress and Exposition, IMECE - Anaheim, CA, United States
Duration: 13 Nov 200419 Nov 2004

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