Junction temperature estimation for an advanced active power cycling test

U. M. Choi, F. Blaabjerg, S. Jorgensen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

On-state collector-emitter voltage (VCE) is a good indicator to determine the wear-out condition of power device modules. Further, it is a one of the Temperature Sensitive Electrical Parameters (TSEPs) and thus can be used for junction temperature estimation. In this paper, the junction temperature estimation method using on-state VCE for an advanced active power cycling test is proposed. The concept of the advanced power cycling test is explained first. Afterwards the junction temperature estimation method using on-state VCE and current is presented. Further, the method to improve the accuracy of the maximum junction temperature estimation is also proposed. Finally, the validity and effectiveness of the proposed method is confirmed by experimental results.

Original languageEnglish
Title of host publication9th International Conference on Power Electronics - ECCE Asia
Subtitle of host publication"Green World with Power Electronics", ICPE 2015-ECCE Asia
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2944-2950
Number of pages7
ISBN (Electronic)9788957082546
DOIs
StatePublished - 27 Jul 2015
Event9th International Conference on Power Electronics - ECCE Asia, ICPE 2015-ECCE Asia - Seoul, Korea, Republic of
Duration: 1 Jun 20155 Jun 2015

Publication series

Name9th International Conference on Power Electronics - ECCE Asia: "Green World with Power Electronics", ICPE 2015-ECCE Asia

Conference

Conference9th International Conference on Power Electronics - ECCE Asia, ICPE 2015-ECCE Asia
Country/TerritoryKorea, Republic of
CitySeoul
Period1/06/155/06/15

Keywords

  • junction temperature estimation
  • Power cycling test
  • power device module
  • TSEP

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