@inproceedings{7e54d74e948b4f5ca252797bdd47de11,
title = "Leakage-Based Temperature Sensor with Incremental Analog-to-Digital Converter",
abstract = "Ahstract-A complementary metal-oxide-semiconductor (CMOS) temperature sensor employing the drain-induced barrier-lowering (DIBL) effect with an incremental analog-to-digital converter (ADC) is presented. The proposed sensor features a compact size and achieves low-power operation utilizing a linearized leakage-current-to-temperature relationship. The incremental ADC is designed for digital readout in real-time.",
keywords = "CMOS temperature sensor, Incremental ADC, leakage-based",
author = "Yeonsu Kim and Myunghyun Jeon and Kim, \{Su Hyeon\} and Nam, \{Jae Won\}",
note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 22nd International SoC Design Conference, ISOCC 2025 ; Conference date: 15-10-2025 Through 18-10-2025",
year = "2025",
doi = "10.1109/ISOCC66390.2025.11329758",
language = "English",
series = "International SoC Design Conference 2025, ISOCC 2025 - Proceedings of Technical Papers",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "International SoC Design Conference 2025, ISOCC 2025 - Proceedings of Technical Papers",
}