Abstract
A Pt/NbOx/TiOy/NbOx/TiN stack integrated on a 30 nm contact via shows a programming current as low as 10 nA and 1 pA for the set and reset switching, respectively, and a self-rectifying ratio as high as ∼105, which are suitable characteristics for low-power memristor applications. It also shows a forming-free characteristic. A charge-trap-associated switching model is proposed to account for this self-rectifying memrisive behavior. In addition, an asymmetric voltage scheme (AVS) to decrease the write power consumption by utilizing this self-rectifying memristor is also described. When the device is used in a 1000 × 1000 crossbar array with the AVS, the programming power can be decreased to 8.0% of the power consumption of a conventional biasing scheme. If the AVS is combined with a nonlinear selector, a power consumption reduction to 0.31% of the reference value is possible.
| Original language | English |
|---|---|
| Pages (from-to) | 6724-6732 |
| Number of pages | 9 |
| Journal | Nano Letters |
| Volume | 16 |
| Issue number | 11 |
| DOIs | |
| State | Published - 9 Nov 2016 |
Keywords
- forming-free
- Low current
- low power
- memristor
- self-rectifying