Low-Power, Self-Rectifying, and Forming-Free Memristor with an Asymmetric Programing Voltage for a High-Density Crossbar Application

  • Kyung Min Kim
  • , Jiaming Zhang
  • , Catherine Graves
  • , J. Joshua Yang
  • , Byung Joon Choi
  • , Cheol Seong Hwang
  • , Zhiyong Li
  • , R. Stanley Williams

Research output: Contribution to journalArticlepeer-review

213 Scopus citations

Abstract

A Pt/NbOx/TiOy/NbOx/TiN stack integrated on a 30 nm contact via shows a programming current as low as 10 nA and 1 pA for the set and reset switching, respectively, and a self-rectifying ratio as high as ∼105, which are suitable characteristics for low-power memristor applications. It also shows a forming-free characteristic. A charge-trap-associated switching model is proposed to account for this self-rectifying memrisive behavior. In addition, an asymmetric voltage scheme (AVS) to decrease the write power consumption by utilizing this self-rectifying memristor is also described. When the device is used in a 1000 × 1000 crossbar array with the AVS, the programming power can be decreased to 8.0% of the power consumption of a conventional biasing scheme. If the AVS is combined with a nonlinear selector, a power consumption reduction to 0.31% of the reference value is possible.

Original languageEnglish
Pages (from-to)6724-6732
Number of pages9
JournalNano Letters
Volume16
Issue number11
DOIs
StatePublished - 9 Nov 2016

Keywords

  • forming-free
  • Low current
  • low power
  • memristor
  • self-rectifying

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