Mixer-Free Phase and Amplitude Comparison Method for Built-in Self- Test of Multiple Channel Beamforming IC

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2 Scopus citations

Abstract

This paper presents a built-in self-test (BIST) method of a multiple channel beamforming IC, based on successive comparisons of phase and amplitude differences between a pair of signals in beamforming channels. This is implemented with a simple difference detection circuit without a mixer and a reference LO. The phase and gain differences of the channels are obtained independently using the proposed simple detector. The phase difference detection accuracy is improved by removing the DC offset caused by the amplitude difference of the signals. The detection circuit is integrated into a 4-channel beamforming IC and the BIST concept verified for both the transmitter and receiver paths. The errors of phase and gain differences between the pair of channels measured through the proposed circuits are as low as to and -0.29dB to 0.38dB for the transmitter and -8.8°to 15.3°and -0.31dB to 0.41dB for the receiver, respectively.

Original languageEnglish
Title of host publication2023 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2023
EditorsJennifer Kitchen, Steven Turner
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages265-268
Number of pages4
ISBN (Electronic)9798350321227
DOIs
StatePublished - 2023
Event2023 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2023 - San Diego, United States
Duration: 11 Jun 202313 Jun 2023

Publication series

NameDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
Volume2023-June
ISSN (Print)1529-2517

Conference

Conference2023 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2023
Country/TerritoryUnited States
CitySan Diego
Period11/06/2313/06/23

Keywords

  • 5G
  • beamforming
  • built-in self-test
  • mm-wave transceiver
  • phased array

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