@inproceedings{a742860905ec4270a7f3822d9adcd42c,
title = "New estimation method of sample properties in dynamic AFM",
abstract = "This study presents a novel estimation method of sample properties in dynamic mode Atomic Force Microscope (AFM). A cantilever mock system without the interaction with sample is used to generate a reference trajectory for deflection and the control synthesis problem is posed in a robust optimal control and multi-objective LMI framework. This design assumes the nonlinear tip-sample interaction force as a disturbance and estimates it through disturbance rejection technique. The sample topography and properties can be obtained by interpreting the estimated tip-sample interaction force and applying tip-sample interaction models.",
keywords = "Atomic force microscopy, Dynamic AFM, Mock system, Property estimation",
author = "Chibum Lee and Gayathri Mohan",
year = "2013",
doi = "10.4028/www.scientific.net/AMR.684.377",
language = "English",
isbn = "9783037856680",
series = "Advanced Materials Research",
pages = "377--380",
booktitle = "Advances in Applied Materials and Electronics Engineering II",
note = "2nd International Conference on Applied Materials and Electronics Engineering, AMEE 2013 ; Conference date: 19-04-2013 Through 20-04-2013",
}