Abstract
p-Type SnO thin films were fabricated via reactive RF magnetron sputtering on borosilicate substrates with an Sn target and Ar/O2/N2 gas mixture. The undoped SnO thin film consisted of a polycrystalline SnO phase with a preferred (1 0 1) orientation; however, with nitrogen doping, the preferred orientation was suppressed and the grain size decreased. The electrical conductivity of the undoped SnO thin films demonstrated a relatively low p-type conductivity of 0.05 Ω-1 cm-1 and it was lowered slightly with nitrogen doping to 0.039 Ω-1 cm -1. The results of the X-ray photoelectron spectroscopy suggested that the nitrogen doping created donor defects in the SnO thin films causing lower electrical conductivity. Lastly, both the undoped and doped SnO thin films had poor optical transmittance in the visible range.
| Original language | English |
|---|---|
| Pages (from-to) | 1470-1475 |
| Number of pages | 6 |
| Journal | Materials Science and Engineering: B |
| Volume | 177 |
| Issue number | 16 |
| DOIs | |
| State | Published - 20 Sep 2012 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
Keywords
- Nitrogen
- Sputtering
- Tin oxide
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