Noise properties of the spin-valve transistor

O. M.J. Van't Erve, P. S. Anil Kumar, R. Jansen, S. D. Kim, R. Vlutters, J. C. Lodder, A. A. Smits, W. J.M. De Jonge

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Noise measurements have been performed on a spin-valve transistor. This transistor consists of a Pt/NiFe/Au/Co/Au multilayer sandwiched between two semiconductors. For comparison, we also studied metal base transistors with a Pt/Au or Pt/NiFe/Au base. All samples show full shot noise in the collector current. The inclusion of a spin-valve in the base layer decreases the absolute value of the collector current and with it the noise level but it does not change the nature of the noise in this device. Similarly, the collector current, and therefore, the noise changes as a function of magnetic field for the spin-valve transistor, but no additional noise of magnetic origin is observed.

Original languageEnglish
Pages (from-to)192-195
Number of pages4
JournalSensors and Actuators A: Physical
Volume91
Issue number1-2
DOIs
StatePublished - 5 Jun 2001

Keywords

  • Hot electron
  • Metal base transistor
  • Noise
  • Schottky barrier
  • Spin-valve

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