Abstract
A new imaging method utilizing the lateral resonance vibration of a cantilever in atomic force microscopy was applied to evaluate microcontact printed patterns of self-assembled monolayers. The lateral resonance vibration of a cantilever was excited by the feedback of the torsional signal detected optically to a shear piezo set at the base of the cantilever. The amplitude and frequency shift of the vibration were mapped as images in air and in vacuum. The phase-separated patterns of octadecanethiol and 16-mercaptohexadecanoic acid on gold substrates were observed in air using a contact-mode cantilever and -CH 3-terminated cantilever, respectively. In most cases, amplitude mapping showed a similar contrast to friction force microscopy but with a better lateral resolution and contrast. In the case where the vibration amplitude was smaller than 3 nm, adhesive force was dominant on the image contrast. The observation using a noncontact-mode cantilever in vacuum gave a good contrast, where the tip-sample distance was controlled by maintaining a set lateral amplitude.
| Original language | English |
|---|---|
| Pages (from-to) | 4533-4536 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 43 |
| Issue number | 7 B |
| DOIs | |
| State | Published - Jul 2004 |
Keywords
- Lateral resonant vibration
- Scanning force microscope
- Self-assembled monolayer
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