Optical and electrical properties of Si doped polar and nonpolar GaN

Keun Man Song, Chang Zoo Kim, Hogyoung Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We investigated the optical and electrical properties of Si-doped polar (c-plane) and nonpolar (a-plane) GaN layers grown by metal-organic vapor phase epitaxy (MOVPE) using photoluminescence (PL) and Hall-effect measurements. For c-plane GaN, the dominant emission bands were related to band-acceptor and donor-acceptor transitions, and mobility was dominated by optical phonon and ionized impurity scattering at high and low temperature, respectively. For a-plane GaN, the dominant emission bands were related to extended defects such as basal stacking faults (BSFs) and prismatic stacking faults (PSFs) and mobility was dominated by the scattering mechanism due to dislocations.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - Proceedings of the 31st International Conference on the Physics of Semiconductors, ICPS 2012
PublisherAmerican Institute of Physics Inc.
Pages65-66
Number of pages2
ISBN (Print)9780735411944
DOIs
StatePublished - 2013
Event31st International Conference on the Physics of Semiconductors, ICPS 2012 - Zurich, Switzerland
Duration: 29 Jul 20123 Aug 2012

Publication series

NameAIP Conference Proceedings
Volume1566
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference31st International Conference on the Physics of Semiconductors, ICPS 2012
Country/TerritorySwitzerland
CityZurich
Period29/07/123/08/12

Keywords

  • GaN
  • Hall-effect
  • Mobility
  • Photoluminescence
  • Stacking faults

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