TY - JOUR
T1 - Optimized Time Series Feature Selection for Manufacturing AI
T2 - Reducing Complexity and Improving Classification Accuracy
AU - Jang, Jaeseok
AU - Jung, Chanyoung
AU - Jung, Hail
N1 - Publisher Copyright:
© 2013 IEEE.
PY - 2025
Y1 - 2025
N2 - Although AI enhances productivity and quality in manufacturing, real-time validation remains difficult due to the complexity and high-dimensionality of time series data under strict inference time requirements. To address this, we propose two time series feature selection strategies. First, we extract meaningful variables by analyzing the time series patterns of non-defective and defective products. Through STL decomposition, we eliminate high-frequency noise and seasonal effects, and transform conventional feature-wise PCA into a production-wise approach by independently analyzing each sensor across products. We further quantify the pattern differences between non-defective and defective products for each sensor using DTW similarity, and perform clustering to systematically select significant variables. Second, we reconstruct lightweight statistical features through ANOVA and correlation analysis to further reduce feature dimensionality. In experiments on real-world manufacturing datasets, our techniques improve predictive performance and achieve reduced inference latency, successfully satisfying strict real-time production constraints.
AB - Although AI enhances productivity and quality in manufacturing, real-time validation remains difficult due to the complexity and high-dimensionality of time series data under strict inference time requirements. To address this, we propose two time series feature selection strategies. First, we extract meaningful variables by analyzing the time series patterns of non-defective and defective products. Through STL decomposition, we eliminate high-frequency noise and seasonal effects, and transform conventional feature-wise PCA into a production-wise approach by independently analyzing each sensor across products. We further quantify the pattern differences between non-defective and defective products for each sensor using DTW similarity, and perform clustering to systematically select significant variables. Second, we reconstruct lightweight statistical features through ANOVA and correlation analysis to further reduce feature dimensionality. In experiments on real-world manufacturing datasets, our techniques improve predictive performance and achieve reduced inference latency, successfully satisfying strict real-time production constraints.
KW - Artificial intelligence
KW - computational efficiency
KW - deep learning
KW - feature selection
KW - industrial AI
KW - machine learning
KW - smart manufacturing
KW - time series classification
UR - https://www.scopus.com/pages/publications/105008786752
U2 - 10.1109/ACCESS.2025.3582216
DO - 10.1109/ACCESS.2025.3582216
M3 - Article
AN - SCOPUS:105008786752
SN - 2169-3536
VL - 13
SP - 110208
EP - 110225
JO - IEEE Access
JF - IEEE Access
ER -