Pd-doped Sn-Ag-Cu-In solder material for high drop/shock reliability

A. Mi Yu, Jun Ki Kim, Jong Hyun Lee, Mok Soon Kim

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Pd was chosen as a minor alloying element in a new Sn-1.2Ag-0.7Cu-0.4In solder alloy to improve the drop/shock reliability. The tensile properties and drop/shock reliability of the new Sn-1.2Ag-0.7Cu-0.4In-0.03Pd solder alloy was compared with those of the Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu alloys. The UTS, yield strength and elongation of Sn-1.2Ag-0.7Cu-0.4In-0.03Pd were superior to those of the other alloys tested. Sn-1.2Ag-0.7Cu-0.4In-0.03Pd showed outstanding drop/shock reliability compared to the representative Pb-free solder, Sn-3.0Ag-0.5Cu. Therefore, the Sn-1.2Ag-0.7Cu-0.4In-0.03Pd composition is assessed to be an alternative Pb-free solder composition that may replace Sn-3.0Ag-0.5Cu.

Original languageEnglish
Pages (from-to)359-361
Number of pages3
JournalMaterials Research Bulletin
Volume45
Issue number3
DOIs
StatePublished - Mar 2010

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