TY - JOUR
T1 - Permittivity and permeability measurements of a thin film with patterned anisotropy at microwave frequencies
AU - Chung, Jae Young
N1 - Publisher Copyright:
© 1965-2012 IEEE.
PY - 2015/4/1
Y1 - 2015/4/1
N2 - We propose a measurement technique to retrieve the constitutive parameters of a magnetic alloy composite in the form of thin film. Frequency of interest is 0.5 MHz-2.5 GHz, and the sample under test is patterned along the hard axis exhibiting in-plane anisotropy. To measure both the in-plane permittivity and permeability of the film, we prepare two separate planar transmission line fixtures, and then collect the transmission coefficient with the sample inserted in the fixtures. The in-plane permittivity and permeability are extracted from the transmission coefficient using a two-step retrieval process, namely, calculating the effective parameters out from the transmission coefficient and calculating the sample parameters out from the effective parameters. The latter is implemented by means of curve fitting a set of full-wave simulation data, instead of conventional quasi-static analyses, enabling broadband characterization in the microwave frequency range.
AB - We propose a measurement technique to retrieve the constitutive parameters of a magnetic alloy composite in the form of thin film. Frequency of interest is 0.5 MHz-2.5 GHz, and the sample under test is patterned along the hard axis exhibiting in-plane anisotropy. To measure both the in-plane permittivity and permeability of the film, we prepare two separate planar transmission line fixtures, and then collect the transmission coefficient with the sample inserted in the fixtures. The in-plane permittivity and permeability are extracted from the transmission coefficient using a two-step retrieval process, namely, calculating the effective parameters out from the transmission coefficient and calculating the sample parameters out from the effective parameters. The latter is implemented by means of curve fitting a set of full-wave simulation data, instead of conventional quasi-static analyses, enabling broadband characterization in the microwave frequency range.
KW - Microstrip circuits
KW - microwave measurements
KW - permeability measurement
KW - permittivity measurement
KW - thin films
UR - http://www.scopus.com/inward/record.url?scp=84930507270&partnerID=8YFLogxK
U2 - 10.1109/TMAG.2014.2323214
DO - 10.1109/TMAG.2014.2323214
M3 - Article
AN - SCOPUS:84930507270
SN - 0018-9464
VL - 51
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
IS - 4
M1 - 6814906
ER -