Poster: A novel variable-centric fault localization technique

Jeongho Kim, Jindae Kim, Eunseok Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Fault localization is one of the most important debugging tasks. Therefore, many techniques have already been developed to improve the efficiency. Among them, the spectrum-based fault localization technique is the most popular, and it has been the subject of 35% of total fault localization-related studies. SFL techniques leverage coverage spectra and localize a fault based on the coverage difference between passed and failed test cases. However, it is difficult to localize faults effectively when coverage differences are not clear. Therefore, we propose a novel variable-centric fault localization technique to improve performance of existing techniques. Proposed technique extracts suspicious variables and uses them to generate a suspicious ranked list. In an evaluation with 120 C faults, the proposed technique outperforms SFL techniques with the same similarity coefficient. The average Exam score of proposed techniques are reduced by 55% compared to SFL techniques.

Original languageEnglish
Title of host publicationProceedings - International Conference on Software Engineering
PublisherIEEE Computer Society
Pages252-253
Number of pages2
ISBN (Electronic)9781450356633
DOIs
StatePublished - 27 May 2018
Event40th ACM/IEEE International Conference on Software Engineering, ICSE 2018 - Gothenburg, Sweden
Duration: 27 May 20183 Jun 2018

Publication series

NameProceedings - International Conference on Software Engineering
ISSN (Print)0270-5257

Conference

Conference40th ACM/IEEE International Conference on Software Engineering, ICSE 2018
Country/TerritorySweden
CityGothenburg
Period27/05/183/06/18

Keywords

  • Software debugging
  • Software testing
  • Spectrum-based fault localization
  • Suspicious variable
  • Variable-centric

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