Abstract
Resistance switching memory operating by a purely electronic switching mechanism, which was first realized in Pt-dispersed SiO2 thin films, satisfies criteria including high uniformity, fast switching speed, and long retention for non-volatile memory application. This resistive element obeys Ohm's law for the area dependence, but its resistance exponentially increases with the film thickness, which provides new freedom to tailor the device characteristics.
| Original language | English |
|---|---|
| Pages (from-to) | 3847-3852 |
| Number of pages | 6 |
| Journal | Advanced Materials |
| Volume | 23 |
| Issue number | 33 |
| DOIs | |
| State | Published - 1 Sep 2011 |
Keywords
- charge transport
- data storage
- electronic processes
- electronic structures
- hybrid materials
- thin films
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