Reaction Characteristics of the In-15Pb-5Ag Solder with a Au/Ni/Cu Pad and Their Effects on Mechanical Properties

Jong Hyun Lee, Yong Seong Eom, Kwang Seong Choi, Byung Seok Choi, Ho Gyeong Yoon, Jong Tae Moon, Yong Seog Kim

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Reaction characteristics of the In-15Pb-5Ag (wt.%) solder with a Au/Ni/Cu pad during reflow soldering and aging treatment were examined. Interfacial reaction during reflow resulted in either an AuIn2 or Ni 28In72 layer, depending on reflow time. The AuIn 2 layer became thinner and disappeared from the interface, and only the Ni28In72 layer grew with the progress of aging treatment at 130°C. Based on those observations, the dissolution rate of the Au top layer was estimated, and the behavior of the AuIn2 layer during reflow and aging treatment was discussed. In addition, peak shear load and fracture energy of the solder bump were measured as a function of reflow time and aging treatment. The results were compared with those measured with the Sn-37Pb solder bump.

Original languageEnglish
Pages (from-to)277-282
Number of pages6
JournalJournal of Electronic Materials
Volume33
Issue number4
DOIs
StatePublished - Apr 2004

Keywords

  • Aging
  • Au dissolution
  • Au embrittlement
  • In-15Pb-5Ag solder
  • Reflow

Fingerprint

Dive into the research topics of 'Reaction Characteristics of the In-15Pb-5Ag Solder with a Au/Ni/Cu Pad and Their Effects on Mechanical Properties'. Together they form a unique fingerprint.

Cite this