Skip to main navigation Skip to search Skip to main content

Realistic finite element analysis model of the pilgering process to deal with initial tube thickness nonuniformity

  • S. H. Chung
  • , S. W. Jeong
  • , W. J. Chung
  • , M. S. Joun
    • MFRC
    • Gyeongsang National University

    Research output: Contribution to journalArticlepeer-review

    9 Scopus citations

    Abstract

    Traditional finite element analysis (FEA) models for simulating the pilgering process, based on the assumption of a fixed rigid mandrel and uniformity of the initial tube thickness, have practical disadvantages in solving industrial problems due to tube thickness nonuniformity and related mandrel deformation. A novel FEA model of the pilgering process with initial tube nonuniformity is presented herein, using an implicit elasto-thermoviscoplastic finite element method (FEM) with tetrahedral MINI-elements and multi-body treatment scheme, with an emphasis on the moveable and deformable mandrel and practical boundary conditions for the tube material. The effects of the number of layers in the radial direction on the predictions are investigated. The variation in thickness ratio with stroke during the pilgering process is predicted. It has been shown that the pilgering process considerably improves tube eccentricity.

    Original languageEnglish
    Pages (from-to)217-228
    Number of pages12
    JournalJournal of Manufacturing Processes
    Volume95
    DOIs
    StatePublished - 9 Jun 2023

    UN SDGs

    This output contributes to the following UN Sustainable Development Goals (SDGs)

    1. SDG 3 - Good Health and Well-being
      SDG 3 Good Health and Well-being

    Keywords

    • Cold pilgering
    • Deformable mandrel
    • Multi-body treatment scheme
    • Practical FEA model
    • Thickness nonuniformity

    Fingerprint

    Dive into the research topics of 'Realistic finite element analysis model of the pilgering process to deal with initial tube thickness nonuniformity'. Together they form a unique fingerprint.

    Cite this