Reliability metrics extraction for power electronics converter stressed by thermal cycles

Ke Ma, Ui Min Choi, Frede Blaabjerg

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Due to the continuous demands for highly reliable and cost-effective power conversion, the quantified reliability performances of the power electronics converter are becoming emerging needs. The existing reliability modelling approaches for the power electronics converter mainly focuses on the predictions of lifetime, accumulated damage, constant failure rate or Mean-Time-To-Failure (MTTF), while the time-varying and probability-distributed characteristics of the reliability are rarely involved. In this paper, more complete metrics are introduced to quantify and characterize the reliability performance of power electronics system. The final predicted results showed good accuracy with much more reliability information compared to the existing approaches, and the quantified reliability correlation to the mission profiles of converter is mathematically established.

Original languageEnglish
Title of host publication2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3838-3843
Number of pages6
ISBN (Electronic)9781509029983
DOIs
StatePublished - 3 Nov 2017
Event9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017 - Cincinnati, United States
Duration: 1 Oct 20175 Oct 2017

Publication series

Name2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
Volume2017-January

Conference

Conference9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017
Country/TerritoryUnited States
CityCincinnati
Period1/10/175/10/17

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